Hioki DC resistance meters measure a broad range of resistance values at a high level of precision. The RM3542A delivers high-speed and high-stability measurements and improved productivity by minimizing variations and reducing contact errors. In addition, the low-impact measurement technology lets you measure resistance for miniature 008004-size electronic parts. Key Features • Applied voltage limit function lets you switch the detection voltage to 5 V or less • Contact improvement function suppresses rush current to aid in probing of super-small components • Extensive selection of measurement ranges ensures the right detection voltage and delivers stable measurement • Scaling function corrects for mounting state and test stage differences

Gently measure minuscule electronic components (0201 size) with functionality for limiting the applied voltage By limiting the voltage that is applied during measurement to 5 V or less, the RM3542A makes it possible to measure 0201-size components that have low rated voltages without stressing the parts.


Ensure reliable contact quickly with the contact improvement function  
The RM3542A improves contact with measurement specimens by eliminating oxide films and dirt between the probes and specimens. By addressing faulty contact, the instrument facilitates stable measurement and reduces the contact error rate, boosting productivity.

Utilize a more evolved contact improvement function in low-power measurement The RM3542A allows contact improvement to be used in a broader range of situations, for example testing of compact ferrite beads and minuscule, 0201-size resistors, by limiting the inrush current that flows to the measurement specimen during operation of the function.


Use the scaling function to correct measurements as if the target component were mounted  
The RM3542A’s scaling function can correct for the difference in resistance values that are obtained when testing a given component alone and when it is mounted on a circuit board (due to the factors such as the effects of probing position). This feature is useful when testing low-resistance current-sensing resistors such as shunts.